- Street: 380 Tennant Ave
- City: Morgan Hill
- State: California
- Country: United States
- Zip/Postal Code: 95037
- Listed: March 21, 2017 11:34 pm
- Expires: 9207 days, 1 hour
Model: Electroglas 1034 Prober (EG 1034XA, EG 1034X-6A)
Original Equipment Manufacturer: Electroglas
Condition: 11 sets were refurbished,like new and 7 sets are used not test
Valid Time: Subject to prior sale
Quantity: 18 sets
Lead Time: Ready To Go
Location: Morgan Hill, CA, U.S.A.
Price: Only $33,000.00 totally at AS IS,WHERE IS condition and $35,000.00 totally at AS IS,WHERE IS condition with crating.
Warranty: N/A. We sell them at AS IS, WHERE IS condition.
Installation and training: Available at extra charge
Service Contract: Available at extra charge
The ELECTROGLAS 1034 (EG 1034XA and EG 1034X-6A) Automatic Wafer Prober is a precision instrument for testing and classifying semiconductor devices in wafer form. The Model EG 1034X (EG 1034XA and EG 1034X-6A) is a self-contained system comprising two modules, a prober module and a power module. Both modules are designed for compact bench-top mounting; however, an interconnecting cable permits remote mounting of the power module when desired.
The Electroglas 1034 Prober ( EG 1034XA and EG 1034X-6A) is designed for operational simplicity and fast wafer throughput. The unique ELECI’ROGLAS/XYNETICS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position. Simplified manual and semi-automatic controls assure rapid wafer alignment by automatic gross positioning, simplified theta alignment, and precise device alignment by use of a multi-function joystick that provides 20 different manual commands in a single control. The high-speed automatic probing cycle provides automatic indexing, probing and inking of all devices on the wafer under preprogrammed indexing control, and automatic return to the load position when probing is complete. The system accommodates up to 6-inch wafers and provides indexing in either English or metric system units.