Metrology Instrument

• Atomic Force Microscopes-AFM
• Air Velocity Humidity Moisture
• Bench Top Instruments
• Chromatograph
• Confocal Scanning,3-D Video
• Critical Dimension (CD) Measurement,Line Width
• Defect,Particle,Contamination, Detection,Review,Inspect
• Die Inspection,Die Shear
• Ellipsometer,Film Thickness, Uniformity Measurement
• ESCA,Ultrasonic, Acoustical Microscopes
• Fiber Optic Inspection Instruments
• Flat, Notch Finding
• Leak Detection 
• Optical Microscopes
• Overlay Measurement
• Package Inspection,Lead Scanners
• Particle Monitors,Analyzers
• Plate Inspection 
• Resistivity Measurement, 4 point probe, Sheet resistance
• SEM,Focused Ion Beam (FIB), TEM
• Spectrometers,FTIR,ATR-FTIR,Auger Electron (AES),SIMS
• Stress, Refractive Index,Reflectivity,Conductivity Meas
• Thermal Sensing, Measurement, Analysis
• Topology, Nanotopography, Flatness, Cryst.Orient,Metrology
• Wafer Probe, CV (capacitance-to-voltage)
• Wire Bonding Inspection,Test
• X-ray, XRF, 3-D X-Ray, LEXES